Crack and residue free conformal deposited silicon oxide with predictable and uniform etching characteristics

ABSTRACT

A silicon oxide layer is formed by oxidation or decomposition of a silicon precursor gas in an oxygen-rich environment followed by annealing. The silicon oxide layer may be formed with slightly compressive stress to yield, following annealing, an oxide layer having very low stress. The silicon oxide layer thus formed is readily etched without resulting residue using HF-vapor.

CROSS-REFERENCE TO RELATED APPLICATION

This application is a divisional of, and incorporates herein byreference in their entirety the contents of, U.S. patent applicationSer. No. 10/713,172, which was filed on Nov. 14, 2003.

BACKGROUND

The present invention relates generally to a method of forming and/oretching silicon oxide during the fabrication of a semiconductorstructure, an optical device, or an electromechanical system. Siliconoxide layers formed in accordance with the present invention haveparticular application in the field of microelectromechanical systems(MEMS).

The term “MEMS” is used to describe a broad class of electromechanicalsystems having one or more micro and/or nano-sized components. MEMS arecharacterized in their implementation by the use of micro-machiningtechniques, such as lithographic and other precision fabricationtechniques, to reduce mechanical components to a scale generallycomparable to microelectronics. MEMS are further characterized in mostinstances by the operative assembly, arrangement and/or formation ofthese miniaturized components on a silicon substrate. Contemporaryexamples of MEMS-implemented devices include sensors, actuators,gyroscopes, resonators and accelerometers.

The delicate mechanical structures used in conventional MEMS aretypically sealed in a chamber. The chamber may be formed using ahermetically sealed metal container or by the bonding of a semiconductoror glass-like substrate having a chamber to house, accommodate or coverthe mechanical structure. However, it can be difficult to costeffectively integrate MEMS that employ a hermetically sealed metalcontainer or a bonded semiconductor or glass-like substrate to protectthe mechanical structures on the same substrate with high performanceintegrated circuitry. In this regard, the additional processing requiredto integrate the high performance integrated circuitry tends to eitherdamage or destroy the mechanical structures.

Another technique for forming a chamber to protect the delicatemechanical structures employs micromachining techniques. Using thisapproach, a mechanical structure is encapsulated in a chamber using aconventional oxide (SiO₂) deposited or formed using conventionaltechniques, such as oxidation using low temperature techniques (LTO),tetraethoxysilane (TEOS), or the like. Thereafter, this combination isenclosed under a silicon layer or other material, and the oxide removed.When implementing this technique, the mechanical structure isencapsulated prior to packaging and/or integration with integratedcircuitry.

Such oxides often exhibits high tensile stress, particularly atdeposition corners or steps. Further, such oxides are often formed ordeposited in a manner that provides poor coverage of the underlyingsurface(s). These shortcomings may impact the integrity and/orperformance of the MEMS.

Moreover, the removal of conventional oxides during the formation ofMEMS may produce an etch residue on the mechanical structures during theencapsulation process. This etch residue may impact the integrity of themechanical structures and, as such, the performance or operatingcharacteristics of the MEMS (for example, the operating characteristicsof a resonator).

In practice, MEMS formed in accordance with conventional techniquesoften suffer from significant process-induced performance variations oroutright component failure. To a great extent, inadequacies associatedwith the formation and/or removal of oxide layers account for many ofthese failures and undesired performance variations.

First, many conventional oxide layers crack during MEMS fabrication,and/or damage or crack the MEMS structure on which they are deposited.Cracking occurs during deposition of the oxide and/or during hightemperature processing steps applied to the MEMS following deposition ofan oxide layer. These high temperature processes may range intemperature from 800° C. to 1200° C. Too avoid cracking the internalstress of an oxide layer must be well controlled. Both highly tensileand highly compressive oxide layers are undesirable. Highly tensileoxide layers may deform delicate MEMS components or crack outright.Highly compressive oxide layers may also deform MEMS components or causetensile cracking in these components or in adjacent materials.

It is well understood that deposited oxides tend to densify or shrinkwhen annealed at high temperature. This tendency creates tensile stressin the deposited oxide. In addition, as fabrication temperature rises, apreviously deposited oxide on silicon becomes relatively tensile becausethe thermal expansion coefficient for the oxide is less than that of theadjacent silicon. Under the combined effect of these tendencies, anoxide layer deposited at moderate temperature may crack or may damagethe MEMS structures when subsequently heated to significantly highertemperatures.

In many applications, the etch rate of an oxide used in the formation ofa MEMS structure must be well controlled and uniform, from batch tobatch, across each batch, and across each substrate. This isparticularly true where the formation of a MEMS structure requires thatsome portion of an oxide be left in place while another portion of theoxide is etched away, and where the extent of the oxide etch determineswhat portion remains. This condition, often called a ‘timed etch,”requires that the oxide etch at a predetermined, predictable, uniform,and homogenous rate.

In many applications, it is highly desirable for the oxide to beconformal. Conformal deposition of an oxide over a MEMS structureprovides uniform coating and fills structural gaps with a minimum ofdeposited oxide on the upper-most surface of the substrate.Unfortunately, highly conformal, conventional oxides are oftensusceptible to cracking and often contain materials that result inresidue formation when the oxide is subsequently etched.

In many MEMS applications, an oxide must be readily susceptible toetching without producing a residue. Conventional oxides deposited fromcompounds like TEOS are rich in carbon and other contaminates. Suchcontaminates promote the development of etch residues. This isparticularly true where deposited oxides are subsequently exposed tohigh temperature. Conventional oxides also tend to form inclusions whenexposed to high temperatures. Etch residues, which tend to be silicon innature, can accumulate to the point where the etching process becomesuneven across an etch surface or impossible. Etch residues canaccumulate to the point where device functionality becomes impaired.

The adverse impact of etch residues is highly notable in the context ofMEMS fabrication. To a much greater extent than conventionalsemiconductor fabrications, MEMS fabrications require deep cavity oxideetching. HF-vapor etching is particularly sensitive to the formation ofa residue since no “washing” mechanism exists to remove residue, ascontrasted to wet etching processes. Unlike many conventionalsemiconductor fabrications, a wet etching process often cannot beapplied to removal of an accumulated residue during some MEMSfabrications. Accordingly, an oxide free from etch residue isparticularly important to MEMS fabrications.

The desired thickness for oxide layers used during the formation of MEMSvaries considerably. This variation notwithstanding the depositionthickness for an oxide layer must be well controlled. The deposition ofan oxide layer may be performed many times during the formation of MEMS.Accordingly, the time required to deposit an oxide layer is a materialeconomics consideration in the determination of a MEMS fabricationprocess.

In sum, an ideal oxide would deposit and anneal without cracking Itwould have low, well controlled stress. It would contain minimalcontaminants or inclusions even after being exposed to hightemperatures. It would be conformal. It would etch at a predictable,homogeneous rate. It would etch in HF vapor without leaving a residue,especially after being exposed to high temperatures. Finally, it woulddeposit sufficiently fast to economically form layers of varying,well-controlled thickness.

Unfortunately, many of these desirable properties are at odds one withanother. For example, highly conformal, conventional oxides are prone tocracking and often contain contaminants that promote etch residue.

There remains a need for an oxide having many, if not all, of thedesirable qualities noted above. Such an oxide would provide particularadvantage in the fabrication of MEMS.

SUMMARY OF THE INVENTION

The present invention is described hereafter and claimed below inmultiple aspects. In one aspect, a method according to the presentinvention provides silicon oxide having many, if not all, of the desiredproperties noted above. That is, a highly conformal, low stress,non-cracking silicon oxide layer is obtained by a method in which asilicon precursor gas is decomposed or oxidized in a deposition chambercontaining a substrate at a first temperature. The silicon precursor gasmay be any gas containing silicon. Ready examples of a silicon precursorgas that may be used to good advantage include tetaethoxysilane (TEOS),silane (SiH₄), dichlorosilane (DCS), diethlysilane (DES), and/ortetramethylcyclotetrasiloxane (TOMCATS). The deposition may be enhancedwith plasma or ozone. Following deposition of the silicon oxide layer,the deposition chamber is heated to a second temperature higher than thefirst temperature to anneal the silicon oxide layer. Alternatively, thesubstrates are moved to a second chamber for annealing.

Iterative deposition and annealing of the silicon oxide layer inaccordance with this aspect of the present invention results in a highlyconformal silicon oxide layer having well-controlled stress and reducedcontaminants and inclusions. The marked reduction in contaminants andinclusions allows the silicon oxide to be subsequently etched withoutformation of significant residue.

In a related aspect, the silicon precursor gas is preferably providedinto a deposition chamber having an oxygen rich environment. Similarly,annealing of the silicon oxide layer is preferably performed in anoxidizing atmosphere. It is often preferred that the second (annealing)temperature should be approximate to or as high as the highestprocessing temperature subsequently applied to the substrate followingformation of the silicon oxide layer.

In another aspect, the present invention also provides a method offorming a MEMS structure on a substrate. Where an oxide layer,sacrificial or otherwise, is beneficial to the formation of a MEMS, themethod of the present invention may be advantageously applied. This isparticularly true for MEMS applications where a sealing chamber for amechanical or an electromechanical structure is required.

In a related aspect, an oxide layer provided by the method of thepresent invention may be deposited with well-defined and well-controlledstress. For example, it is often advantageous for an oxide layer to beformed over a MEMS component with slightly compressive stress such thata subsequent annealing step yields an oxide layer only slightly tensile,and thus unlikely to fail.

In all of the foregoing aspects, the present invention may be applied todoped and undoped oxides.

Further, the present invention provides a method of HF vapor etching anoxide layer formed in accordance with the present invention. This methodeffectively removes the oxide and any resulting etch residue whereoverly silicon-rich or carbon contaminated conditions exist.

BRIEF DESCRIPTION OF THE DRAWINGS

In the course of the description to follow, reference will be made tothe attached drawings. These drawings show different aspects of thepresent invention and, where appropriate, reference numeralsillustrating like structures, components, materials and/or elements indifferent figures are labeled similarly. It is understood that variouscombinations of the structures, components, materials and/or elements,other than those specifically shown, are contemplated and are within thescope of the present invention.

FIGS. 1A through 1C illustrate the formation of a MEMS and highlight inone example the role of an oxide layer within a MEMS fabrication;

FIG. 2 further illustrates use of an oxide layer formed in accordancewith the present invention in the formation of a MEMS structure;

FIG. 3 is a general schematic illustration of a first deposition chambersuitable for use in the making of a silicon oxide layer according to thepresent invention;

FIG. 4 is a general schematic illustration of a second depositionchamber suitable for use in the making of a silicon oxide layeraccording to the present invention;

FIG. 5 is a flowchart outlining methods steps in one presently preferredembodiment of the present invention;

FIGS. 6A and 6B illustrate fabrication problems associated with thickdepositions of conventional oxides over a trench structure;

FIGS. 7A through 7F illustrate a presently preferred method ofdepositing an oxide layer over a trench structure in accordance with thepresent invention; and,

FIG. 8 is a flowchart illustrating an exemplary method of HF vaporetching an oxide layer formed in accordance with the present invention.

DETAILED DESCRIPTION

The present invention, in its multiple related aspects, is describedbelow using a number of examples. For clarity, these examples are drawnto some specific teaching embodiments.

In a first aspect, the present invention recognizes a unique combinationof benefits afforded by the iterative annealing of an oxide layer underprescribed conditions. The term “layer” is used as a practicaldescription for any spatially and/or temporally specific oxideformation. It should not be read as being limited to only longhorizontally disposed structures, although such structures are mostcommonly formed by conventional deposition techniques. Any area portion,segment, spot, strata, etc., may be considered a “layer” for purposes ofthis description.

By “iterative”, i.e., one or more times following oxide layer formation,annealing an oxide layer according to the dictates of the presentinvention, the stress of the oxide is well-controlled and contaminatesand inclusions within the oxide layer are significantly reduced. It isknown that an annealing step can be used to change the stress of anoxide layer. Indeed, the stress of oxide layers used in conventionalsemiconductor fabrications and high voltage isolation layers have beenmodified by annealing for some time now. Further, is known that manycontaminants may be “burned-out” of an oxide layer by exposing the oxidelayer to high temperature. However, the present invention firstrecognizes that under properly controlled conditions, oxide stress maybe managed AND both contaminants and inclusions may be removed from anoxide layer.

An “inclusion” is different from a “contaminant” within the context ofthis description. A clear example of this difference may be understoodby considering an example. We assume the use of a silane TEOS precursorgas for the formation of a silicon oxide layer. Conventional wisdomrecognizes that carbon atoms are likely to contaminate the layer ofoxidized silicon derived from the TEOS. Such contamination may beuniform across the oxide layer. The carbon atoms can be subsequentlyremoved by heating the silicon oxide layer to a temperature sufficientto burn off the carbon.

Unfortunately, some silicon oxide layers formed from an oxidized,silicon precursor gas also includes free, partially free, or singlybonded silicon atoms. Free silicon atoms are not fully bonded to oxygento form silicon oxide molecules within the oxide layer. An oxide layerhaving free silicon atoms in material quantity is referred to as a“non-stochiometric” oxide.

When exposed to high temperature, the free silicon atoms in anon-stochiometric oxide become mobile and seek out chemical bonds. Suchbonds are often found, particularly in the absence of sufficient oxygen,with other silicon atoms. Mutually bonded silicon atoms, often alongwith associated trapped contaminants, may form clusters. Such clustersare termed “inclusions.” Inclusions may be unequally distributedthroughout the oxide layer. Further, the use of conventional techniquesfor removing contaminants only reinforces or grows the inclusions, and a“stochiometric” oxide layer having pronounced silicon inclusionsresults.

When a stochiometric oxide layer is subjected to a subsequent HF-vaporetching process, the silicon oxide is removed, but the siliconinclusions remain behind as a tough, silicon-based residue insusceptibleto the vapor etching. The silicon residue formed by vapor etching astochiometric oxide resembles an amorphous silicon powder. When vaporetched, a 1 to 5 micron thick oxide layer may yield an order of 0.1micron thick crust of this powdery, snow-like, silicon residue.

Unlike conventional techniques directed to contamination removal, thepresent invention provides a method of forming an oxide that addressesand mitigates the effects of contaminants and inclusions, while at thesame time allowing stress within the oxide layer to remainwell-controlled.

The formation of an exemplary MEMS structure is illustrated in FIGS. 1Athrough 1C. In relevant portion as shown in FIG. 1A, a MEMS structure 12is formed on a first oxide layer 14 over a substrate 11. MEMS structure12 can be a single mechanical or electromechanical component or acombination of multiple components. MEMS structure 12 is laterallyseparated from a surrounding silicon layer 10 by gap 15. In the simpleillustrated example, gap 15 surrounds a single MEMS structure 12.However, in actual practice, gap 15 may be a complex cavity or chamberholding one or more MEMS structures which may include more gaps 15 aspart of their structure.

Following formation of these elements, a second oxide layer 16 isdeposited and patterned to fill gap 15 and cover MEMS structure 12. See,FIG. 1B. Thereafter, as shown in FIG. 1C, an epitaxal polysilicon layer20 is formed over second oxide layer 16. Materials other than epitaxalpolysilicon can be used, such as a nitride or metal (e.g., aluminum)layer. In one advantageous approach, silicon layer 20 is subsequentlyplanarized and vented 21 to allow etching of the sacrificial oxidelayers 16 and 14. The MEMS structure 12 is mechanically freed uponremoval of the first and second oxide layers. This may be accomplishedusing any one of a number of conventional etching processes applied tooxide layers 16 and 14 through vents 21. HF-vapor etching is welladapted for this purpose.

Commonly assigned U.S. patent application Ser. Nos. 10/454,867 and10/455,555, both filed Jun. 4, 2003 further describe a number ofembodiments in which one or more oxide layers, including sacrificialoxide layers, are deposited and/or etched in the formation of variousencapsulation structures for MEMS components. Both of these applicationsare hereby incorporated by reference in their entirety. Additionally,U.S. patent application Ser. No. 10/018,180 filed Sep. 9, 2002 and Ser.No. 10/240,339 filed May 9, 2003 are hereby incorporated by reference.

Silicon oxide may be used to good advantage as a sacrificial layerrequired to form the foregoing example and their like. However, theperformance requirements for such an oxide are significant, includingone or more of the following characteristics. The oxide must not deformthe mechanical structure it is deposited over, or crack the surroundingmaterial layers. Hence, stress in the oxide layer must be wellcontrolled. The oxide layer must be sufficiently conformal to fill gapsand cover MEMS structure(s). Further, the sacrificial oxide layer(s)must etch well without the production of a residue that would precludecomplete etching or impair device operation.

FIG. 2 further illustrates use of an oxide layer formed in accordancewith the present invention in the fabrication of a MEMS. Of note, theuniform etch rate provided by the oxide layer allows well-controlled,partial etching (i.e., a timed etch) of complex cavities. In FIG. 2, aburied oxide layer 6 is formed over a substrate 11, e.g., a conventionalSilicon-On Insulator (SOI) structure. Thereafter, a MEMS layer 8 isformed, including MEMS structure 12. An oxide layer formed in accordancewith the present invention is formed over the MEMS layer 8 and anencapsulation layer 7 is formed over the entire structure.

The oxide layer is subsequently etched through gaps 21 (vent holes)formed in encapsulation layer 7. By careful control of the etch process,all or part of the various portions of the respective oxide layers maybe removed. For example, one portion 4 of the oxide layer formed inaccordance with the present invention is completely removed to form acomplex cavity while another portion 5 remains in the final structure.Similarly, selected portions of the buried oxide layer 6 may be removedduring the etch process. (Naturally the buried oxide may also be formedusing the present invention). In any event, well-controlled etch fronts3 are maintained during the etch process. The desired size of theremaining portions of the respective oxide layers are determined by theetch characteristics of the oxide, e.g., the etch rate and etchuniformity.

In one presently preferred embodiment, the method of the presentinvention provides for a low-pressure chemical vapor deposition (LPCVD)of silicon oxide from a reaction of a silicon precursor gas, namely,tetraethoxysilane (TEOS). Other deposition processes may alternativelybe used. Alternative examples of a silicon precursor gas include, forexample, silane (SiH₄) dichlorosilane (DCS), diethysilane (DES), andtetramethylcyclotetrasiloxane (TOMCATS). Ozone processes are alsopossible including, for example, ozone-TEOS. Furthermore, plasmaprocesses, such as plasma enhanced chemical vapor deposition (PECVD) maybe used to form the oxide layer contemplated by the present invention.

Deposition of a silicon oxide layer formed in accordance with thepresent invention may be accomplished in an wafer processing system suchas the one schematically illustrated in FIG. 3. This figure describesuse within the context of the present invention of a conventionalhot-walled LPCVD tube 22. A silicon precursor gas, preferably TEOS, isintroduced near faceplate 25 and flows over a collection of one or morewafers 24 assembled in a holding rack 23. Controller 40 controlsoperation of the hot-walled LPCVD tube 22 generally, including heatingelements 36, and an assembly of gas flow control valves 39. Followingreaction, gases (e.g., reaction products and un-reacted precursors) areexhausted by means of an evacuation pump 26.

Another conventional wafer processing system well adapted for use withinthe context of the present invention is schematically illustrated inFIG. 4. The system generally comprises a process chamber 30, a gas panel31, and a control unit 40, along with other hardware components, such aspower supplies and vacuum pumps, and control software.

The process chamber 30 generally houses a support pedestal 34, which isused to support a one or more wafers 35 within the chamber. Depending onthe specific process being performed, wafers 35 can be heated to adesired temperature prior to silicon oxide deposition using, forexample, an embedded heating element 36. A temperature sensor 37, suchas a thermocouple, may also be embedded in support pedestal 34. Themeasured temperature within the chamber is used in a feedback loop tocontrol a power supply (not shown) driving heating element 36, such thatwafers 35 are maintained at a desired temperature.

A vacuum pump 38 is used to evacuate process chamber 30 and to maintainproper gas flows and pressure inside chamber 30. A showerhead 32 throughwhich gases are introduced into chamber 30 is located above supportpedestal 34. Showerhead 32 is connected to gas panel 31 that controlsthe supply of various gases during a process sequence. Proper controland regulation of gas flows through panel 31 are accomplished by massflow meter(s) 39 and controller 40. Multiple gas cylinders containing,for example, TEOS, oxygen (O₂), ozone (O₃), helium (He), nitrogen (N₂),ozone (O₃), etc., are connected to gas panel 31. Showerhead 32 allowsprocess gases from gas panel 32 to be uniformly introduced anddistributed in process chamber 30.

Plasma depositions may be accomplished by the provision of electrodes(not shown) within the exemplary deposition chamber shown in FIG. 3.Plasma enhanced CVD is much faster than the LPCVD example discussed inrelation to the example above in which TEOS is used as a siliconprecursor gas in a LPCVD deposition. Ozone-assisted TEOS also results inmuch improved deposition rates.

The exact layout and operation of a deposition chamber is a function ofthe specific silicon precursor gas being used, the desired depositionrate and ultimate thickness of the oxide layer desired, and the numberof wafers being processed at one time.

The method of forming an oxide layer according to the present inventionmay be implemented in many conventional wafer processing systems,including as additional examples batch plasma and ozone systems. Themethod allows deposition of a highly conformal, non-cracking, siliconoxide layer that may be etched without residue. In yet another aspect,the method of the present invention may be characterized by the stepsshown in the flowchart of FIG. 5. These steps include:

-   1. depositing an oxide layer on a substrate at a first temperature    (Step 50);-   2. annealing the oxide layer at a second temperature higher than the    first temperature (Step 51); and,-   3. repeating these steps, upon a determination that the required    deposition thickness has not been achieved (Step 52=No).

The deposition step may be accomplished using any one or more of anumber of conventionally available silicon precursor gases. Low pressureand high pressure deposition processes may successfully be used in theformation of the oxide layer.

In a related aspect of the present invention, oxide deposition ispreferably performed in an oxygen-rich environment. With availableexcess oxygen, the number of free silicon atoms found in the resultingsilicon oxide layer is reduced. Any process step or sequence of stepsfor ensuring that sufficient oxygen atoms are available to materiallyreduce the number of free carbon and/or silicon atoms in a resultingoxide layer is termed providing “an oxygen-rich environment.” However,while an oxygen rich environment is beneficial it is not required.

The annealing step may be successfully performed at atmosphericpressure, as well as high and low pressures. It may be performed in thedeposition chamber or in a second chamber, for example, a standardoxidation furnace. As with the deposition step, it is presentlypreferred that the annealing step take place in an oxygen-richenvironment, but this is not required. Indeed, certain adaptations ofthe present invention benefit from an annealing step performed in anon-oxidizing atmosphere. However, omission of the annealing step yieldsa silicon oxide layer susceptible to subsequent cracking at hightemperatures and prone to leaving etch residues.

The process steps described above may be repeated as necessary to form asilicon oxide layer having a desired thickness. Oxide layers having athickness ranging from 0.5 to 5.0 μm have been successfully formed, butthis is just a presently preferred range. Oxide thickness will vary byspecific application. In many applications a single cycle of steps 1 and2 above will provide a silicon oxide layer of sufficient thickness.

As a further illustration of the method according to the presentinvention, high quality silicon oxide may be deposited using LPCVD-TEOSat a first temperature of 680° C., a pressure of 1.6 T, with a TEOS flowrate of 30 sccm, and with an oxygen flow rate of 300 sccm. Acceptablesilicon oxide layers may be formed at a first temperature ranging from650 to 750° C., and across a range of pressures from 0.2 to 10 T. TEOSand O₂ flow rates in the above example may be varied by a decade up anddown with acceptable results.

Typical annealing parameters include a second temperature of 1100° C.applied to the deposited silicon oxide in an oxygen-rich environment.Acceptable silicon oxide layers may be formed across an annealingtemperature range of from 700 to 1200° C. Annealing temperatures higherthan 1200° C. are possible, but not commonly used in MEMS fabrications.Lower annealing temperatures do not crack the silicon oxide, butthermally stabilize the oxide layer only up to or around the annealingtemperature. Subsequent processing steps applied to the substrate havinga temperature materially higher than that used to anneal the siliconoxide layer may crack the oxide. Accordingly, it is presently preferredthat the silicon oxide layer be annealed at a second temperatureapproximate to, or higher than the highest temperature applied to thesubstrate during subsequent processing steps.

As with some conventional oxide layers, high temperature annealing tendsto increase the tensile stress of the silicon oxide layer formed by thepresent invention. Accordingly, in yet another aspect of the presentinvention, it is preferred to initially deposit a slightly compressiveoxide layer, such that the subsequent annealing step results in asilicon oxide layer having very low stress. Further, some silicon oxidelayers covering large areas cannot be annealed as a continuous filmwithout cracking In such cases, the total coverage area may be patternedinto smaller coverage areas and annealed. Oxides covering these smallerareas are much less likely to crack during annealing. The size of thecoverage area should be determined in relation to the second (annealing)temperature and the desired (or acceptable) thickness of the oxidelayer.

The ambient environment used during the silicon oxide annealing step ispreferably oxygen-rich, but may alternatively or additionally includenitrogen, argon, ozone or steam. Nitrogen anneals may reduce subsequentcracking in the silicon oxide layer, but are less effective in removingcontaminate inclusions that may subsequently produce a residue duringetching.

Relatively thick oxide layers are prone to cracking. They are also morelikely to crack surrounding layers or deform MEMS components. Thus,determining the desired thickness for a silicon oxide layer formed inaccordance with the present invention must take into account manyfactors, including; the selected annealing temperature, the size, form,and material of the covered MEMS structure, and the shape and extent ofthe patterning to be performed on the silicon oxide layer. With anun-patterned LPCVD TEOS, as described above, a silicon oxide layerthickness of approximately one micron may readily be achieved. For oxidelayers having a desired thickness equal to or less than one micron, asingle deposition- and-anneal cycle may suffice.

Where relatively thicker silicon oxide layers are desired the cycle ofsteps described above may be repeated as desired. A typical sequence forthe exemplary LPCVD using TEOS described above includes three cycles toform a silicon oxide layer having a thickness of two microns. In manyapplications, multiple thin depositions will be preferred to a singledeposition of sufficient thickness. This is true even where a thickerdeposition layer is practical. That is, multiple thin depositions willaid in oxide layer uniformity and coverage. Complete annealing all theway through the silicon oxide layer is also promoted by the use ofmultiple thin deposition cycles. The deposition thickness of the siliconoxide layer according to the present invention is well controlled andadapted for single cycle as well as multiple cycle processes.

The use of multiple, relatively thinner oxide layers is furtherillustrated in FIGS. 6A, 6B, and FIG. 7A through 7F. FIGS. 6A and 6Billustrate the difficulty of properly forming an oxide layer over atrench structure 61 using only a single, relatively think layer 60.While the surface of the underlying structure and the sidewalls of thetrench structure are covered by oxide layer 60, a fill gap 64 is alsoformed between the sidewalls. This gap is sometimes called a “chimney”or a “keyhole.” Stress associated with fill gap 64 is concentrated atpoint 62. Accordingly when oxide layer 60 is annealed, a crack 63 isformed form due to the additional stress caused by shrinkage of oxidelayer 60.

This problem is avoided by the use of multiple iterations of the depositand anneal process described above. As shown in FIGS. 7A and 7B, afirst, relatively thin (first) oxide layer 70 is formed over anunderlying structure, including a trench structure. When annealed, oxidelayer 70 shrinks to form a first annealed layer 71 having a reducedthickness as compared with layer 70. Second and third iterations of thisprocess result respectively in second deposition layer 72, secondannealed layer 73, third deposition layer 74 and third annealed layer75. See, FIGS. 7C through 7E.

A fill gap 80 and/or crack 84 may form during the second (or otherintervening) iteration. However, the third iteration effectively fillsthe gap or crack and results in a well formed, final oxide layer 85.Only three iterations are shown in the above example, but any reasonablenumber of deposition and anneal iterations may be used to form a finaloxide layer effectively covering a trench or similar structure.

The degree to which a silicon oxide layer formed in accordance with thepresent invention is conformal is also well controlled. This high degreeof control over deposition thickness and layer conformity, in additionto its crack-resistance and excellent etching characteristics make thesilicon oxide layer formed according to the present invention ideal foruse in some MEMS fabrications.

A silicon oxide layer formed according to the present invention isremarkably resilient to cracking It may be formed with very low internalstress, if desired, and with well controlled stress in every instance.The annealing step removes (or precludes the introduction of)contaminants and inclusions. Accordingly, the silicon oxide layer formedby the present invention may be readily etched, using HF-vapor forexample, without producing etch residue. It also etches at apredictable, homogeneous rate, such that a wet etch, vapor etch, orplasma etch process applied to the silicon oxide layer will yielduniform etch fronts.

In a yet another aspect, the present invention provides a method forHF-vapor etching of a silicon oxide layer formed as described above.Effective HF-vapor etching without residue formation can not beeffectively accomplished in an overly silicon-rich or carboncontaminated oxide layer. If excess silicon is present in the oxide,then the silicon oxide layer may be first etched down to a residue, leftto sit in an ambient oxygen environment for some period of time, andthereafter etched again. Residue oxidation may be accelerated in anoxidizing environment. For example, an oxygen plasma may be applied to asubstrate having an etch reside. Such alternatives to a clean oxide,while effective, are less preferred as being more time consuming. Yet,such less preferred alternatives still fall within the scope of thepresent invention.

An exemplary method of HF vapor etching an oxide layer formed inaccordance with the present invention is shown in FIG. 8. The methodbegins with the step of etching the oxide (90). Thereafter, anyresulting etch residue is oxidized (91). Where an etch residue isapparent (92=No), it is further etched (return to 90) followingoxidation. Once the oxide and any etch residue are removed (92=Yes), themethod is complete.

The oxide formed in accordance with the present invention may doped orundoped. An entire oxide region or selected portions (or layers) of theoxide region can be doped. Where selected portions or layers of an oxideare doped, differential etch rates (or characteristics) may be obtained,as between the doped and undoped portions or layers. Such differentialetch rates allow, for example, removal of the doped regions or layerswhile leaving the undoped regions and layers. Further, a doped oxide canbe used to dope the MEMS structure.

A single dopant can be used. For example, by doping the oxide withboron, a borosilicate glass (BSG) is formed. Similarly, phosphorus maybe used as an oxide dopant to form phosphosilicate glass (PSG). Multipledopants can also be used within the context of the present invention.For instance, boron and phosphorus can be used as oxide co-dopants toform borophosphosilicate glass (BPSG).

The oxide can be doped with the inclusion of a dopant containing gas,such as diborane (B₂H₆) or phosphorus oxychloride (POCl₃).Alternatively, the dopants can be implanted using any one or more of anumber of conventional techniques.

The addition of dopant(s) has the potential advantages of; decreasingthe anneal temperature, decreasing the oxide stress, increasing theoxide deposition rate, increasing the oxide etch rate, gettering andtrapping impurities, improving the oxide deposition conformality, andreflowing (thus smoothing and planarizing) the oxide during annealing.

A number of process variations and trade-offs have been noted above. Thepresent invention is susceptible to numerous refinements and adaptationsthat will be apparent to those of ordinary skill in the art. In thecontext of the foregoing description and the attached claims, a“substrate” is broadly defined as any surface, with or without a MEMSstructure, upon which an oxide might be formed. When an oxide is said tobe formed “on” a substrate, this expression is not limited to theformation of the oxide directly on the substrate, but includes oxideformations on any surface previously formed on the substrate. The terms“forming” and “depositing (or deposition)” are used to broadly describeany process step or sequence of process steps allowing the production ofan oxide. The terms “oxidizing” or “oxidation” broadly denote anydecomposition of a gas or gases in the presence of oxygen.

MEMS fabrication processes are well recognized as being subject tovaried implementations and modifications. The discussion above teachesseveral clear examples of how the present invention may be made usingconventionally available deposition chambers. Only a few alternativeshave been described above in the context of teaching examples. Thepresent invention is not limited to these examples, but is defined bythe attached claims.

1-30. (canceled)
 31. A method of sealing a chamber of anelectromechanical device having a mechanical structure overlying asubstrate, wherein the mechanical structure is in the chamber, themethod comprising: depositing a sacrificial oxide layer over at least aportion of the mechanical structure by oxidizing a silicon precursor gasat a first temperature; annealing the sacrificial oxide layer at asecond temperature higher than the first temperature; depositing a firstencapsulation layer over the sacrificial oxide layer; forming at leastone vent through the first encapsulation layer to allow removal of atleast a portion of the sacrificial oxide layer; removing at least aportion of the sacrificial oxide layer to form the chamber; depositing asecond encapsulation layer over or in the vent to seal the chamberwherein the second encapsulation layer is a semiconductor material. 32.The method of claim 31, wherein depositing the sacrificial oxide layeris performed in an oxygen-rich environment.
 33. The method of claim 32,wherein annealing the sacrificial oxide layer is performed in anoxygen-rich environment.
 34. The method of claim 31, wherein thesemiconductor material is comprised of polycrystalline silicon,amorphous silicon, silicon carbide, silicon/germanium, germanium, orgallium arsenide.
 35. The method of claim 34, wherein the firstencapsulation layer is comprised of a polycrystalline silicon, amorphoussilicon, germanium, silicon/germanium or gallium arsenide.
 36. Themethod of claim 31, wherein a first portion of the first encapsulationlayer is comprised of a monocrystalline silicon and a second portion iscomprised of a polycrystalline silicon.
 37. The method of claim 31,wherein removing at least a portion of the sacrificial oxide layer toform the chamber comprises: exposing the sacrificial oxide layer to anetching process through the vent.
 38. The method of claim 37, whereinthe etching processes comprises a HF-vapor etching process.
 39. Themethod of claim 31, wherein the silicon precursor gas comprises at leastone gas selected from a group of gases consisting of; tetaethoxysilane(TEOS), silane (SiH₄), dichlorosilane (DCS), diethlysilane (DES), and/ortetramethylcyclotetrasiloxane (TOMCATS).
 40. The method of claim 31,wherein the silicon oxide layer is formed with a compressive stress,such that following the step of heating the substrate, the silicon oxidelayer has very low internal stress. 41-55. (canceled)